Published in
American Institute of Physics, Applied Physics Letters, 18(106), p. 182104, 2015
DOI: 10.1063/1.4921010
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Characterization of locally strained Ge1−xSnx/Ge fine structures by synchrotron X-ray microdiffraction
Journal article published in 2015 by
Shinichi Ike,
Osamu Nakatsuka,
Yoshihiko Moriyama,
Masashi Kurosawa,
Noriyuki Taoka,
Yasuhiko Imai,
Shigeru Kimura 
,
Tsutomu Tezuka,
Shigeaki Zaima
,
Tsutomu Tezuka,
Shigeaki Zaima
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
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