Anomalous C-V response correlated to relaxation processes in TiO2 thin film based-metal-insulator-metal capacitor: Effect of titanium and oxygen defects

American Institute of Physics, Journal of Applied Physics, 15(117), p. 154101

Journal article published in 2015 by A. Kahouli, C. Marichy, A. Sylvestre, N. Pinna

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