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American Institute of Physics, Review of Scientific Instruments, 7(86), p. 071901

DOI: 10.1063/1.4926899

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Preface: High-pressure studies with x-rays

Journal article published in 2015 by Guoyin Shen ORCID, Stanislav Sinogeikin
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

Full text: Unavailable

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Preprint: archiving allowed
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Postprint: archiving allowed
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Data provided by SHERPA/RoMEO

Abstract

The study of matter at extreme conditions represents a forefront area of research activity across the sciences, including physics, chemistry, materials science, and even biology. Advancing the frontier of extreme conditions science requires powerful micro-sampling probes to access minute samples through the vessel walls and to separate weak sample signals from the background signals arising from the much more massive surrounding vessel materials. A plethora of x-ray diffraction (XRD), x-ray spectroscopy, and x-ray imaging techniques has been developed and integrated with high pressure and high/low temperature capabilities at HPCAT. High-pressure x-ray diffraction, using energy or angular dispersive modes, provides comprehensive crystallographic, electron density topology, bonding, grain boundary, elastic, and deformation information from single-crystal, polycrystalline, nanocrystalline, and noncrystalline substances.