Published in

American Chemical Society, Journal of Physical Chemistry C, 32(117), p. 16297-16305, 2013

DOI: 10.1021/jp403544a

Links

Tools

Export citation

Search in Google Scholar

Reduction of NiO to Ni in Nanocrystalline Composite NiO/Ce0.9Gd0.1O2-δ Porous Thin Films: Microstructure Evolution Through in Situ Impedance Spectroscopy

This paper is available in a repository.
This paper is available in a repository.

Full text: Download

Green circle
Preprint: archiving allowed
  • Must obtain written permission from Editor
  • Must not violate ACS ethical Guidelines
Orange circle
Postprint: archiving restricted
  • Must obtain written permission from Editor
  • Must not violate ACS ethical Guidelines
Red circle
Published version: archiving forbidden
Data provided by SHERPA/RoMEO

Abstract

Microstructure stability and electrical properties of Ni(O)–GDC (Ce0.9Gd0.1O2-δ) porous thin films were studied by both in situ X-ray diffraction and in situ impedance spectroscopy during the reduction of NiO into metallic Ni. The initial microstructure of the NiO/GDC porous thin film is composed of particles with diameter ≤10 nm delimitating a porous volume of 40%. The thin films microstructure is composed of two types of interpenetrated network, porous and inorganic. The different steps that take place during the reduction for Ni(O)–GDC porous thin films were highlighted and discussed based on the determination of their respective activation energy. The percolation threshold for metallic Ni appears when the Ni content reached a value of 30 vol %. Coarsening and coalescence of nickel particles occur at high temperature leading to a decrease in the total film conductivity with time. Finally, films containing 70 vol % of Ni keep a conductivity of 1 × 105 S/cm after heat treatment at 400 °C for 1000 min. This study shows that impedance spectroscopy is a useful tool to follow the reduction of NiO into Ni in GDC mesoporous film. It constitutes an aid for defining the experimental conditions (temperature and reducing time), keeping both good electrical and catalytic performances and for studying the evolution of the microstructure when films are maintained under H2 with time.