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American Institute of Physics, Applied Physics Letters, 23(95), p. 232109

DOI: 10.1063/1.3272918

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Impact of dopant compensation on the deactivation of boron-oxygen recombination centers in crystalline silicon

Journal article published in 2009 by Bianca Lim, An Liu ORCID, Daniel Macdonald, Karsten Bothe, Jan Schmidt
This paper is available in a repository.
This paper is available in a repository.

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Abstract

The boron-oxygen recombination center responsible for the light-induced degradation of Czochralski silicon solar cells can be permanently deactivated by illumination at elevated temperature. In this study, we examine the impact of dopant compensation on the deactivation process. The experimental results show that the deactivation rate depends inversely on the total boron concentration instead of the net doping concentration, suggesting that boron is directly involved in the deactivation process. A linear dependence of the activation energy on the total boron concentration further supports this conclusion.