A study of ultra-thin film ion beam deposited (IBD) hydrogenated amorphous carbon (a-C:H) using atomic force microscopy (AFM) and transmission electron microscopy (TEM)

Elsevier, Diamond and Related Materials, 7(7), p. 1054-1058

Journal article published in 1998 by R. W. Lamberton, J. F. Zhao, D. Magill, J. A. McLaughlin

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