Published in

Ninth European Powder Diffraction Conference

DOI: 10.1524/9783486992526-042

Oldenbourg Verlag, Zeitschrift für Kristallographie Supplements, suppl_23_2006(2006), p. 243-248

DOI: 10.1524/zksu.2006.suppl_23.243

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FAULTS, a new program for refinement of powder diffraction patterns from layered structures

Journal article published in 1970 by M. Casas Cabanas ORCID, J. Rodriguez Carvajal, Palacin Mr, M. R. Palacín
This paper is available in a repository.
This paper is available in a repository.

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Abstract

A new program for refinement of layered structures is herein presented. FAULTS is based in the DIFFaX program, developed by Treacy et al. [1], which simulates selected area electron diffraction and powder (X-ray and neutrons) diffraction patterns by means of a recursion algorithm that calculates the incoherent sum of diffracted intensities of layered structures of any crystal system containing planar defects. In order to deal with the limitations of a simple simulation, refinement of all the parameters involved in the calculation of the diffracted intensities has been implemented in FAULTS.