Detailed knowledge of the internal structure of nanocrystals is of major importance in order to understand and monitor new physical properties. However, the experimental characterization remains challenging. The development of coherent X-ray sources at third-generation synchrotrons opens new possibilities based on the high sensitivity of the coherent beam with the internal nanocrystal displacement field. This paper aims at illustrating the use of coherent X-ray Bragg diffraction for crystalline defect investigation and lens-less imaging of morphology and strain. The two approaches are used to characterize an InAs nanowire sample. Limits of the method and near-future perspectives are discussed in the framework of strain analysis in nanocrystals.