American Institute of Physics, Applied Physics Letters, 16(98), p. 163109
DOI: 10.1063/1.3579533
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We report the observation and characterization of field emission current from individual single- and few-layer graphene flakes laid on a flat SiO 2/ Si substrate. Measurements were performed in a scanning electron microscope chamber equipped with nanoprobes which allowed local measurement of the field emission current. We achieved field emission currents up to 1 μ A from the flat part of graphene flakes at applied fields of few hundred volt per micrometer. We found that the emission process is stable over a period of several hours and that it is well described by a Fowler–Nordheim model for currents over five orders of magnitude.