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Elsevier, Physica C: Superconductivity and its Applications, 1-2(441), p. 83-88

DOI: 10.1016/j.physc.2006.03.129

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DC field emission scanning measurements on electropolished niobium samples

This paper is available in a repository.
This paper is available in a repository.

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Abstract

Electropolished (EP) Nb samples were investigated by a dc field emission scanning microscope, which has recently been modernized for the fast scans on large samples. Measurements on EP samples before and after high pressure rinsing (HPR) are compared. Repro-ducible voltage scans at various surface fields have been obtained partially down to lm resolution. The statistical overview of the density of emitting sites at 120 MV/m shows a reduction from about 30 before to 14 emitters/cm 2 after HPR. Local measurements of selected emitters prove increased onset fields E on at 1 nA and decreased values after HPR. High resolution SEM images and EDX measurements of the identified emitters will also be presented.