Elsevier, Scripta Materialia, 4(60), p. 218-220
DOI: 10.1016/j.scriptamat.2008.10.003
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Low-temperature growth of Pb(Nb0.01Zr0.2Ti0.8)O3 (PNZT) films, as low as 450 °C, was successfully achieved by a sol–gel route using a Pb0.8Ca0.1La0.1Ti0.975O3 (PLCT) seed layer. The influence of precursor concentration of the PLCT seed layer on the orientation and ferroelectric properties of PNZT films was investigated. With increasing concentration of the PLCT seed layer, the PNZT films clearly changed from (1 1 1)-oriented to (1 0 0)-oriented. The PNZT films showed a very square ferroelectric hysteresis loop when the concentration of the PLCT seed layer is 0.05 M.