Published in

Society of Photo-optical Instrumentation Engineers, Proceedings of SPIE, 2003

DOI: 10.1117/12.537582

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<title>Crystallization of 500-nm-thick a-SiGe:H films through ArF-excimer laser radiation</title>

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

It is found that the intensity of resonant light scattering in the region of excitonic transitions in GaAs/AlGaAs quantum-well structures is modulated strongly (up to 40% under our experimental conditions) upon additional pumping of the structure by radiation with the photon energy exceeding the band gap in the barrier layers. The effect observed originates from the redistribution of the oscillator strengths of the excitonic transitions due to the formation of charged three-particle complexes (trions) made possible by the accumulation of nonequilibrium charge carriers of one particular sign (holes in our case) in the quantum wells upon above-barrier pumping.