Published in
Elsevier, Surface Science, 3(465), p. 219-226
DOI: 10.1016/s0039-6028(00)00676-2
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Imaging using tip–surface distance variations vs. voltage in scanning tunneling microscopy
Journal article published in 2000 by
G. Seine,
R. Coratger,
A. Carladous,
F. Ajustron,
R. Pechou,
J. Beauvillain
This paper was not found in any repository, but could be made available legally by the author.
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