Elsevier, Solid State Communications, 7(113), p. 405-410
DOI: 10.1016/s0038-1098(99)00513-x
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The photoluminescence (PL) of SrS:Cu,Ag and SrS1−xSex:Cu,Ag thin films has been investigated. The influence of rapid thermal annealing conditions and Cu dopant concentration on the PL intensity has been studied. The PL emission spectrum was measured as a function of both Cu concentration and temperature. An unexpected PL intensity peak was observed around a temperature of 54 K.