Published in

American Physical Society, Physical Review B, 14(93), 2016

DOI: 10.1103/physrevb.93.140412

Links

Tools

Export citation

Search in Google Scholar

Transverse field muon-spin rotation measurement of the topological anomaly in a thin film of MnSi

Journal article published in 2015 by T. Lancaster, F. Xiao, Z. Salman, I. O. Thomas, S. J. Blundell, F. L. Pratt, S. J. Clark, T. Prokscha, A. Suter ORCID, S. L. Zhang, A. A. Baker, T. Hesjedal ORCID
This paper is available in a repository.
This paper is available in a repository.

Full text: Download

Green circle
Preprint: archiving allowed
Upload
Green circle
Postprint: archiving allowed
Upload
Green circle
Published version: archiving allowed
Upload
Policy details
Data provided by SHERPA/RoMEO

Abstract

We present the results of transverse-field muon-spin rotation measurements on an epitaxially grown 40-nm-thick film of MnSi on Si(111) in the region of the field-temperature phase diagram where a skyrmion phase has been observed in the bulk. We identify changes in the quasistatic magnetic field distribution sampled by the muon, along with evidence for magnetic transitions around and 30 K. Our results suggest that the cone phase is not the only magnetic texture realized in film samples for out-of-plane fields.