Published in
Elsevier, Microelectronics Reliability, 4-5(40), p. 671-674
DOI: 10.1016/s0026-2714(99)00318-2
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Epitaxial ferroelectric PbZrxTi1–xO3 thin films for non-volatile memory applications
Journal article published in 2000 by
C. Guerrero,
C. Ferrater,
J. Roldán,
V. Trtı́k,
F. Sánchez 
,
M. Varela
,
M. Varela
This paper was not found in any repository, but could be made available legally by the author.
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