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American Physical Society, Physical review B, 20(84)

DOI: 10.1103/physrevb.84.205418

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Structural coupling across the LaAlO3/SrTiO3interface: High-resolution x-ray diffraction study

Journal article published in 2011 by J. E. Boschker ORCID, C. Folkman, C. W. Bark ORCID, Å. F. Monsen, E. Folven, J. K. Grepstad, E. Wahlström ORCID, C. B. Eom, T. Tybell
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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Abstract

Here, we demonstrate a structural interaction between LaAlO3 thin films and SrTiO3 substrates using high-resolution x-ray diffraction. X-ray diffraction profiles reveal the presence of periodic lattice distortions in the LaAlO3 thin films, whose in-plane periodicity is determined by the miscut angle and miscut direction of the substrate. We show that the structural distortions in LaAlO3 thin films induce similar distortions in the SrTiO3 substrate.