Published in
Elsevier, Optical Materials, 12(29), p. 1856-1860
DOI: 10.1016/j.optmat.2006.10.013
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Raman and X-ray absorption near-edge structure characterization of GaN implanted with O, Ar, Xe, Te and Au
Journal article published in 2007 by
M. Katsikini 
,
J. Arvanitidis,
E. C. Paloura ,
S. Ves,
E. Wendler,
W. Wesch
,
J. Arvanitidis,
E. C. Paloura ,
S. Ves,
E. Wendler,
W. Wesch
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