Published in
Elsevier, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1-4(238), p. 119-123
DOI: 10.1016/j.nimb.2005.06.030
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High energy X-ray diffraction analysis of strain and residual stress in silicon nitride ceramic diffusion bonds
Journal article published in 2005 by
M. Vila,
C. Prieto 
,
P. Miranzo,
M. I. Osendi,
A. E. Terry,
G. B. M. Vaughan
,
P. Miranzo,
M. I. Osendi,
A. E. Terry,
G. B. M. Vaughan
This paper was not found in any repository, but could be made available legally by the author.
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