Elsevier, Ultramicroscopy, 1-4(71), p. 281-285
DOI: 10.1016/s0304-3991(97)00092-2
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We have used a near-field scanning optical microscope (NSOM) to conduct optical absorption mapping of a thin organic film of poly(phenylene vinylene) (PPV) and tris(8-hydroxy)quinoline aluminum (Alq). Using 488 nm light, NSOM transmission images revealed 100–300 nm `dark' features scattered randomly across the film. However, these `dark' features were not observed using 633 nm light. Simultaneously acquired topographic images revealed no significant changes in surface morphology over the `dark' features and indicated that the optical variation was not related simply to variations in film thickness or optical scattering. The origin of these `dark' features is believed to be related to ordered domains in the thin organic film which has a different absorption spectrum as compared to a disordered film. The change in contrast observed using 488 and 633 nm light was related to the optical absorption difference between the ordered and disordered regions at the two wavelengths.