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IOP Publishing, Superconductor Science and Technology, 8(8), p. 667-672

DOI: 10.1088/0953-2048/8/8/011

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High-temperature superconductor thin-film characterization by the modulated optical reflectance technique

Journal article published in 1995 by D. P. Almond, A. K. Barker, A. C. Bento ORCID, S. K. Singh, N. J. Appleyard, T. J. Jackson, S. B. Palmer
This paper is available in a repository.
This paper is available in a repository.

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Abstract

Measurements are presented of the modulated optical reflectance (MOR) of laser-ablated thin films of YBa2Cu3O7-x having a range of electrical characteristics. It is found that the room-temperature MOR signal provides a good indication of film quality. There is a strong correlation between MOR signal amplitude and a film's normal- and superconducting-state characteristics. The origins of the MOR signal are discussed and it is suggested that it is directly dependent on the characteristic linear temperature dependence of carrier concentration found in high-temperature superconductors. The potential of MOR for superconducting thin-film device inspection is noted.