LA-ICP-MS is one of the most promising techniques for in situ analysis of geological and environmental samples. However, there are some limitations with respect to measurement accuracy, in particular for volatile and siderophile/chalcophile elements, when using non-matrix-matched calibration. We have therefore investigated matrix-related effects with a new 200 nm femtosecond (fs) laser ablation system (NWRFemto200) using reference materials with different matrices and spot sizes from 10 to 55 μm. We also performed similar experiments with two nanosecond (ns) lasers, a 193 nm excimer (ESI NWR 193) and a 213 nm Nd:YAG (NWR UP-213) laser. The ion intensity of the 200 nm fs laser ablation is much lower than that of the 213 nm Nd:YAG laser, because the ablation rate is a factor of about 30 lower. Our experiments did not show significant matrix dependency with the 200 nm fs laser. Therefore, a non-matrix-matched calibration for the multi-element analysis of quite different matrices can be performed. This is demonstrated with analytical results from twenty-two international synthetic silicate glass, geological glass, mineral, phosphate and carbonate reference materials. Calibration was performed with the certified NIST SRM 610 glass, exclusively. Within overall analytical uncertainties, the 200 nm fs LA-ICP-MS data agree with available reference values. This article is protected by copyright. All rights reserved.