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Integrated Photonics: Materials, Devices, and Applications

DOI: 10.1117/12.886820

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Development and optical characterization of vertical tapers in SiON waveguides using gray-scale lithography

Journal article published in 2011 by B. Han, E. Rigo, R. Guider, S. Larcheri, G. Nunzi Conti ORCID, M. R. Vanacharla, A. Chiasera ORCID, M. Ferrari ORCID, L. Pavesi ORCID, G. Pucker, G. C. Righini, M. Ghulinyan ORCID
This paper is available in a repository.
This paper is available in a repository.

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