In the present work, thick (~1 mm) films were realized using polydimethylsiloxane (PDMS) with different concentrations of TiO2 nanoparticles (0.025, 0.05, 0.1, 0.5 and 5 weight %). Angle resolved scattering (ARS) measurements on these films have been performed to explore their optical parameters. In particular, the parameters of anisotropy g and of scatterance s were obtained. We used these data to evaluate their possible use in OLED devices with “ray tracing” simulation. The results obtained showed that the scattering substrate with 0.025% in weight of TiO2 could achieve an improvement in terms of OLED efficiency equal to 16%.