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Proceedings of the 17th International Conference on Pattern Recognition, 2004. ICPR 2004.

DOI: 10.1109/icpr.2004.1333765

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Statistical classification of raw textile defects

Proceedings article published in 2004 by Manuele Bicego, Vittorio Murino ORCID, I. A. Rossi
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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Abstract

The problem of classification of defects occurring in a textile manufacture is addressed. A new classification scheme is devised in which different features, extracted from the gray level histogram, the shape, and cooccurrence matrices, are employed. These features are classified using a support vector machines (SVM) based framework, and an accurate analysis of different multiclass classification schemes and SVM parameters has been carried out. The system has been tested using two textile databases showing very promising results.