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Elsevier, Scripta Materialia, 7(65), p. 642-645, 2011

DOI: 10.1016/j.scriptamat.2011.06.050

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New mechanisms of void growth in Au-Al wire bonds: Volumetric shrinkage and intermetallic oxidation

Journal article published in 2011 by H. Xu, C. Liu, V. V. Silberschmidt ORCID, S. S. Pramana, T. J. White, Z. Chen, V. L. Acoff
This paper is available in a repository.
This paper is available in a repository.

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Abstract

This letter examines void nucleation and coalescence in Au–Al wire bonds using high-resolution transmission electron microscopy. It is found that void formation is not only attributed to Kirkendall-type migration as conventionally believed, but also due to volumetric shrinkage and intermetallic oxidation. A volumetric shrinkage of a few percent is associated with intermetallic growth and phase transformations. Intermetallic oxidation occurs at the intermetallics/alumina interface and the migration of oxygen towards the intermetallics leads to void growth and thickening of the surrounding oxide walls.