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SAXS Structural Characterization of Nanoheterogeneous Conducting Thin Films. A Brief Review of SAXS Theories

Journal article published in 2009 by M. Cattani, M. C. Salvadori, F. S. Teixeira
This paper is available in a repository.
This paper is available in a repository.

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Preprint: policy unknown
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Postprint: policy unknown
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Published version: policy unknown

Abstract

The SAXS (small angle X-ray scattering) technique has been used to determine the fundamental structure of conducting thin films fabricated by implanting gold ions into PMMA (polymethylmethacrylate) polymer. We present a brief review of the SAXS theories necessary to determine the structural properties of our nanoheterogeneous films. ; Comment: 16 pages, no figures