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American Institute of Physics, Journal of Applied Physics, 5(110), p. 052002

DOI: 10.1063/1.3624812

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Local domain engineering in relaxor 0.77PbMg1/3Nb2/3O3-0.23PbSc1/2Nb1/2O3 single crystals

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This paper is available in a repository.

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Abstract

We used piezoresponse force microscopy (PFM) to study the dc bias field-induced domain structure of the (001) oriented single crystals of 0.77PbMg1/3Nb2/3O3-0.23PbSc1/2Nb1/2O3 relaxor. In the as-grown state, no polarization contrast was observed due to the average cubic symmetry of the crystal. Upon application of a dc bias applied via a PFM tip, a stable complex domain pattern, corresponding to a hedgehog-type topological defect, appeared on the surface of the crystal. The shape of these domains depended on the magnitude of the field. If the field was below a threshold, the domains possessed a cylindrical form. Above the threshold, the border between domains became close to a straight line. At high biases and large separation between the pulses, the development of the domains obeyed an avalanche-type dynamics.