Elsevier, Chemical Physics Letters, (623), p. 68-71, 2015
DOI: 10.1016/j.cplett.2015.01.047
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The degradation mechanism of Alq3-based OLED is investigated using low-frequency noise measurements. Devices are driven at constant current mode and constant voltage mode. Our results show that device under constant current mode has a longer lifetime and the device under constant voltage mode generates defects and interface charges much faster. The differences show that the interfacial building up of traps and defects occurs at different pace.