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Elsevier, Carbon, 13(49), p. 4368-4375, 2011

DOI: 10.1016/j.carbon.2011.06.015

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Growth control of single-walled, double-walled, and triple-walled carbon nanotube forests by a priori electrical resistance measurement of catalyst films

Journal article published in 2011 by Wei-Hung Chiang ORCID, Don N. Futaba, Motoo Yumura, Kenji Hata
This paper is available in a repository.
This paper is available in a repository.

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Abstract

We present the wall number control of carbon nanotube (CNT) forests grown on metal cat-alyst films in a water-assisted chemical vapor deposition (CVD) by measuring the sheet resistances of metal catalyst films. Catalyst film thicknesses and thickness variations are monitored using a 2-point-based electrical characterization methodology. The electrical characterization and high-resolution transmission electron microscopy analysis showed that single-, double-, and triple-walled CNT forests were grown on iron (Fe) catalyst films with mean sheet resistances of 646.63, 75.40, and 27.84 MX/sq, respectively. The average wall number and outer diameter of CNT forests were found to linearly depend on the log-arithm of the mean sheet resistances of Fe catalyst films.