Published in
American Institute of Physics, Journal of Applied Physics, 23(116), p. 235301, 2014
DOI: 10.1063/1.4904864
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Potential variation around grain boundaries in BaSi2 films grown on multicrystalline silicon evaluated using Kelvin probe force microscopy
Journal article published in 2014 by
Masakazu Baba,
Kosuke O. Hara 
,
Daichi Tsukahara,
Kaoru Toko,
Noritaka Usami,
Takashi Sekiguchi,
Takashi Suemasu
,
Daichi Tsukahara,
Kaoru Toko,
Noritaka Usami,
Takashi Sekiguchi,
Takashi Suemasu
This paper is available in a repository.
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