2009 35th Annual Conference of IEEE Industrial Electronics
DOI: 10.1109/iecon.2009.5414829
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This article describe the design, fabrication steps and experimental results of a dilatometer that will be used to characterize ceramic samples in terms of thermal expansion. The basic idea is to heat a 25 mm ceramic sample up to 1000°C and register its dimension variations during the rising and the falling of the temperature. The device prototype consists in a master-slave structure since there are two control units: the high-level one (master) and a low-level one (slave). The highlevel control unit will be responsible for supporting the user interface, exchanging and processing the necessary information between the user and the low-level control unit. The low-level control unit main component is a microcontroller. It is responsible for acquiring data from the strain and temperature sensors and controlling the temperature of the samples. The experimental results show that the prototype is appropriate for dilatometry essays once the maximum error was 0.037% of full-scale.