Published in
American Institute of Physics, Journal of Applied Physics, 4(96), p. 2186
DOI: 10.1063/1.1767968
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High oxygen-pressure annealing effects on the ferroelectric and structural properties of PbZr0.3Ti0.7O3 thin films
Journal article published in 2004 by
M. T. Escote,
F. M. Pontes,
E. R. Leite,
E. Longo,
R. F. Jardim,
P. S. Pizani 
This paper is available in a repository.
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