IOP Publishing, Journal of Physics D: Applied Physics, 4A(28), p. A159-A163
DOI: 10.1088/0022-3727/28/4a/031
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We investigate the structural properties of (311) (In,Ga)As/GaAs-heterostructures by means of high-resolution X-ray diffractometry and topography. The low symmetry of the (311) orientation is shown to introduce shear strain. Furthermore, we observe strongly anisotropic diffraction patterns caused by the onset of strain relaxation in heavily strained (311) structures.