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American Institute of Physics, Review of Scientific Instruments, 1(68), p. 165

DOI: 10.1063/1.1147802

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Precise total electron yield measurements for impact of singly or multiply charged ions on clean solid surfaces

Journal article published in 1996 by H. Eder, M. Vana, F. Aumayr ORCID, H. P. Winter
This paper is available in a repository.
This paper is available in a repository.

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Abstract

Total electron yields γ for impact of singly or multiply charged ions (H+, He+, He2+, N3+, N4+, O5+, O6+) on clean polycrystalline gold have been accurately measured at impact energies from almost zero [exclusive potential emission (PE) range] up to 40 keV times projectile charge state q (dominant kinetic emission range). Impact energies above 10 q keV have been approached by postacceleration of ions via target biasing with up to −30 kV. Total electron yields for γ⩾3 have been derived directly from the related electron number statistics (ES) with total experimental errors of ±3%. Smaller values of γ have been determined from the related ES in conjunction with measurements of the respective primary ion, and ejected-electron currents, which caused somewhat larger experimental errors of typically ±5%. At higher impact velocity discrepancies arise between results from ES-based and current-based measurements of the total electron yield, respectively, because of systematic errors of the latter method due to projectile ion reflection and/or secondary ion emission from the target surface. For differently charged ion species, a difference in γ due to the q-related PE stays almost independent of the projectile impact energy. © 1997 American Institute of Physics.