Published in
2003 Conference on Computer Vision and Pattern Recognition Workshop
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- Institute of Electrical and Electronics Engineers
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- [citeseerx.ist.psu.edu] | PDF
- [citeseerx.ist.psu.edu] | PDF
- [www.cs.dartmouth.edu] | PDF
- [www.cse.lehigh.edu] | PDF
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Higher-order Wavelet Statistics and their Application to Digital Forensics
Proceedings article published in 2003 by
Hany Farid,
Siwei Lyu 
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Abstract
We describe a statistical model for natural images that is built upon a multi-scale wavelet decomposition. The model consists of first- and higher-order statistics that capture certain statistical regularities of natural images. We show how this model can be useful in several digital forensic applications, specifically in detecting various types of digital tampering.