Elsevier, Applied Surface Science, (212-213), p. 235-243
DOI: 10.1016/s0169-4332(03)00095-3
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We have combined synchrotron radiation photoemission (PES), X-ray photoelectron diffraction (PED) and low-energy electron diffraction (LEED) to examine the formation of the Ag/Si(1 1 1)-(7×7) interface, throughout a wide silver coverage range. All studied silver films gave rise to a fcc phase with their principal crystallographic axes parallel to the substrate and a [1 1 1] orientation perpendicular to the surface. Angular-scanned PED of the Ag 4p core level showed the formation of well-ordered Ag islands, with the presence of two well-defined domains, both for 6 and 30 ML films. The two domains were rotated 60° from each other and appeared in a 60/40 proportion.