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American Physical Society, Physical Review Letters, 10(101), 2008

DOI: 10.1103/physrevlett.101.107602

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Strain-Induced Polarization Rotation in Epitaxial (001)BiFeO3Thin Films

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Data provided by SHERPA/RoMEO

Abstract

Direct measurement of the remanent polarization of high quality (001)-oriented epitaxial ${\mathrm{BiFeO}}_{3}$ thin films shows a strong strain dependence, even larger than conventional (001)-oriented ${\mathrm{PbTiO}}_{3}$ films. Thermodynamic analysis reveals that a strain-induced polarization rotation mechanism is responsible for the large change in the out-of-plane polarization of (001) ${\mathrm{BiFeO}}_{3}$ with biaxial strain while the spontaneous polarization itself remains almost constant.