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EDP Sciences, The European Physical Journal B, 4(66), p. 455-459

DOI: 10.1140/epjb/e2008-00452-x

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Full X-ray pattern analysis of vacuum deposited pentacene thin films

Journal article published in 2008 by O. Werzer ORCID, B. Stadlober, A. Haase, M. Oehzelt, R. Resel ORCID
This paper is available in a repository.
This paper is available in a repository.

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