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De Gruyter Open, Elektrotechnický časopis / Journal of Electrical Engineering, 5(65), p. 299-303, 2014

DOI: 10.2478/jee-2014-0048

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Structural Characterization of Doped Thick Gainnas Layers - Ambiguities and Challenges

This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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Abstract

GaInNAs alloys are mostly used as an active part of light sources for long wavelength telecom applications. Beside this, these materials are used as thin quantum wells (QWs), and a needs is to grow thick layers of such semiconductor alloys for photodetectors and photovoltaic cells applications. However, structural characterization of the GaInNAs layers is hindered by non-homogeneity of the In and N distributions along the layer. In this work the challenges of the structural characterization of doped thick GaInNAs layers grown by atmospheric pressure metalorganic vapour phase epitaxy (APMOVPE) will be presented. K e y w o r d s: