American Institute of Physics, Journal of Applied Physics, 7(111), p. 073908
DOI: 10.1063/1.3702584
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Microstructure and magnetization reversal of L10-FePt/[Co/Pt]N exchange coupled composite films Appl. Phys. Lett. 100, 142406 (2012) Enhancement of carrier-mediated ferromagnetism in Zr/Fe-codoped In2O3 films Appl. Phys. Lett. 100, 142403 (2012) Reduction in anti-ferromagnetic interactions in ion-beam deposited Fe3O4 thin films J. Appl. Phys. 111, 073901 (2012) Defect-induced room temperature ferromagnetism in un-doped InN film AIP Advances 2, 012185 (2012) Additional information on J. Appl. Phys. We studied a series of square lattice antidot arrays, with diameter and lattice parameter from hundreds of nanometers to some microns, fabricated using two lithography techniques in epitaxial Fe(001) films. The coercivity increase of each array with respect to its base film can be scaled to a simple geometric parameter, irrespective of the lithography technique employed. Magnetic transmission x-ray microscopy studies, in arrays fabricated on polycrystalline Fe films deposited on silicon nitride membranes, evidenced the propagation of reversed domains from the edges of the arrays, in agreement with the coercivity analysis of the epitaxial arrays and with micromagnetic models. V C 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.3702584]