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American Physical Society, Physical review B, 9(79)

DOI: 10.1103/physrevb.79.094405

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Thickness dependence of the exchange bias in epitaxial manganite bilayers

Journal article published in 2008 by A. L. Kobrinskii, A. M. Goldman, Maria Varela ORCID, S. J. Pennycook
This paper is available in a repository.
This paper is available in a repository.

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Abstract

Exchange bias has been studied in a series of La2/3Ca1/3MnO3 / La1/3Ca2/3MnO3 bilayers grown on (001) SrTiO3 substrates by ozone-assisted molecular beam epitaxy. The high crystalline quality of the samples and interfaces has been verified using high-resolution X-ray diffractometry and Z-contrast scanning transmission electron microscopy with electron energy loss spectroscopy. The dependence of exchange bias on the thickness of the antiferromagnetic layer has been investigated. A critical value for the onset of the hysteresis loop shift has been determined. An antiferromagnetic anisotropy constant has been obtained by fitting the results to the generalized Meiklejohn-Bean model. Comment: 7 pages. 8 figures