Published in

Elsevier, Optics and Laser Technology, (60), p. 80-84

DOI: 10.1016/j.optlastec.2014.01.016

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Quantum optical lithography from 1nm resolution to pattern transfer on silicon wafer

Journal article published in 2014 by E. Pavel, S. I. Jinga, B. S. Vasile, A. Dinescu, V. Marinescu, R. Trusca, N. Tosa ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

Many attempts have been made to break the diffraction limit, a major problem in optical lithography. Here, we report and demonstrate a lithography method, quantum optical lithography, able to attain 1 nm resolution by optical means using new materials (fluorescent photosensitive glass–ceramics and QMC-5 resist). The performance is several times better than that described for any optical or electron beam lithography (EBL) methods. The written patterns on resist were transferred to Si wafer. SEM measurements show 5 nm line widths.