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Springer (part of Springer Nature), Applied Physics A: Materials Science and Processing, 2(96), p. 481-487
DOI: 10.1007/s00339-009-5250-y
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Organic film thickness influence on the bias stress instability in Sexithiophene Field Effect Transistors
Journal article published in 2009 by
F. V. Di Girolamo,
C. Aruta 
,
M. Barra,
P. D’Angelo,
A. Cassinese
,
M. Barra,
P. D’Angelo,
A. Cassinese
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