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American Institute of Physics, Journal of Applied Physics, 7(105), p. 07D915

DOI: 10.1063/1.3074096

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Structural analysis of interfacial strained epitaxial BiMnO3 films fabricated by chemical solution deposition

Journal article published in 2009 by Hiroshi Naganuma, Andras Kovacs ORCID, Tetsuro Harima, Hiromi Shima, Soichiro Okamura, Yoshihiko Hirotsu
This paper is available in a repository.
This paper is available in a repository.

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Abstract

An interfacial epitaxial BiMnO 3 layer was fabricated by chemical solution deposition on SrTiO 3 (100) substrate, and the microstructure of the film was analyzed by x-ray diffraction (XRD) and cross-sectional transmission electron microscopy (TEM). The TEM observation revealed the epitaxial growth of BiMnO 3 on the SrTiO 3 substrate as follows: ([110](001)) BiMnO 3||[0-10](001) SrTiO 3 . XRD and TEM analyses revealed that the mismatch between the epitaxial BiMnO 3 and the SrTiO 3 substrate causes a distortion in lattice parameters of BiMnO 3 and, consequently, a large compressive strain in the BiMnO 3 layer.