Published in
American Institute of Physics, Applied Physics Letters, 7(106), p. 071902
DOI: 10.1063/1.4909529
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Strain and lattice orientation distribution in SiN/Ge complementary metal–oxide–semiconductor compatible light emitting microstructures by quick x-ray nano-diffraction microscopy
Journal article published in 2015 by
G. A. Chahine 
,
M. H. Zoellner,
M.-I. Richard,
S. Guha,
C. Reich,
P. Zaumseil,
G. Capellini,
T. Schroeder,
T. U. Schülli
,
M. H. Zoellner,
M.-I. Richard,
S. Guha,
C. Reich,
P. Zaumseil,
G. Capellini,
T. Schroeder,
T. U. Schülli
This paper is available in a repository.
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