Published in

Elsevier, Materials Letters, (143), p. 309-311, 2015

DOI: 10.1016/j.matlet.2014.12.131

Links

Tools

Export citation

Search in Google Scholar

Dynamic scaling of swift heavy ion induced surface restructuring of BaF2 thin film

This paper is available in a repository.
This paper is available in a repository.

Full text: Download

Green circle
Preprint: archiving allowed
Orange circle
Postprint: archiving restricted
Red circle
Published version: archiving forbidden
Data provided by SHERPA/RoMEO

Abstract

Dynamic scaling of swift heavy ions induced cracks in the nanodimensional BaF2 thin films is studied using 100 MeV Au+8 ions at different ion fluences. Atomic force micrographs show that, up to a fluence of 1×1012 ions/cm2, the surface morphology is almost unchanged from virgin film, but thereafter, the formation of cracks is seen. The dimensions and density of the cracks is found to increase with increase in ion fluence. Dynamic scaling of surfaces demonstrates that the surface roughness exponent (α) values are in the range of 0.2–0.5. The growth exponent values are found to be β=0.10±0.03 and 1.1±0.1 for continuous and cracked surfaces, respectively. Shift of X-ray diffraction peaks after irradiation indicates contribution of tensile stress in the crack evolution with ion fluence.