Institute of Electrical and Electronics Engineers, IEEE Photonics Journal, 2(7), p. 1-8, 2015
DOI: 10.1109/jphot.2015.2415672
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The near band edge emission of the tensile-strained $m$-plane ZnO film grown on (112) $hbox{LaAlO}_{3} $ substrates shows abnormal low polarization degree ( $rho = 0.1$) . The temperature dependency of polarization degree clarifies the origins of different emission peaks. In tensile-strained m-plane ZnO, the [0001] polarized state is upper shifted and is overlapping with the [ $11overline{2} 0$] polarized state. This phenomenon causes the abnormal low polarization degree and reveals the effect of strain on the emission anisotropy of $m$-plane ZnO.