Links

Tools

Export citation

Search in Google Scholar

Preparation of Atomically Flat Gold Substrates for AFM Measurements

This paper is available in a repository.
This paper is available in a repository.

Full text: Download

Question mark in circle
Preprint: policy unknown
Question mark in circle
Postprint: policy unknown
Question mark in circle
Published version: policy unknown

Abstract

Sample preparation is the most important part of a successful measurement with an atomic force microscope (AFM). While various kinds of substrates are used for that purpose, atomically flat gold proved to possess some advantages, namely chemical inertness against oxygen, stability against radicals and suitability for formation of self-assembled mono-layers (SAMs) of organic alkanethiols. Fast and simple preparation procedures to achieve quality atomically flat gold substrates are necessary to achieve reproducible results in high resolution imaging. Here we report an improved technique to produce atomically flat gold in a reliable way. We demonstrate its use on the example of high resolution imaging of single walled carbon nanotubes as test molecules.