16th European Symposium on Computer Aided Process Engineering and 9th International Symposium on Process Systems Engineering, p. 1173-1178
DOI: 10.1016/s1570-7946(06)80205-1
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Paper surface plays a key role in paper quality and exhibits a multiscale structure. In this article we present a multiscale statistical process control approach for monitoring relevant surface phenomena developing at different length-scales, namely waviness and roughness. The effectiveness of the proposed approach is demonstrated through computational simulations, as well as through a pilot study involving real paper surface profiles. The results obtained demonstrate its adequacy in tracking down the relevant surface phenomena.